Book Title: Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
Book Subtitle: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Authors: Xiaowei Li, Guihai Yan, Cheng Liu
DOI: https://doi.org/10.1007/978-981-19-8551-5
Publisher: Springer Singapore
eBook Packages: Computer Science, Computer Science (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2023
Hardcover ISBN: 978-981-19-8550-8Published: 02 March 2023
Softcover ISBN: 978-981-19-8553-9Due: 16 March 2024
eBook ISBN: 978-981-19-8551-5Published: 01 March 2023
Edition Number: 1
Number of Pages: XVIII, 304
Number of Illustrations: 1 b/w illustrations